Journal article Open Access

Waveguide Dielectric Permittivity Measurement Technique Based on Resonant FSS Filters

Costa, Filippo; Amabile, Claudio; Monorchio, Agostino; Prati, Enrico

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<oai_dc:dc xmlns:dc="" xmlns:oai_dc="" xmlns:xsi="" xsi:schemaLocation="">
  <dc:creator>Costa, Filippo</dc:creator>
  <dc:creator>Amabile, Claudio</dc:creator>
  <dc:creator>Monorchio, Agostino</dc:creator>
  <dc:creator>Prati, Enrico</dc:creator>
  <dc:description>A method to determine the dielectric permittivity of materials is presented. Such a method exploits the use of a low-cost frequency selective structure (FSS), transversally placed in a waveguide in the proximity of the sample under test. The presence of the additional dielectric placed close to the FSS leads to a shift of bandpass and bandstop resonance frequencies. The relationship between the frequency shift and the permittivity of the dielectric under test allows the determination of the unknown permittivity. Such a procedure is particularly suitable for measuring the dielectric permittivity of thin slabs.</dc:description>
  <dc:title>Waveguide Dielectric Permittivity Measurement Technique Based on Resonant FSS Filters</dc:title>
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