June 1, 2011 Journal article Open Access

Costa, Filippo; Amabile, Claudio; Monorchio, Agostino; Prati, Enrico

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{
  "description": "A method to determine the dielectric permittivity of materials is presented. Such a method exploits the use of a low-cost frequency selective structure (FSS), transversally placed in a waveguide in the proximity of the sample under test. The presence of the additional dielectric placed close to the FSS leads to a shift of bandpass and bandstop resonance frequencies. The relationship between the frequency shift and the permittivity of the dielectric under test allows the determination of the unknown permittivity. Such a procedure is particularly suitable for measuring the dielectric permittivity of thin slabs.", 
  "license": "", 
  "creator": [
    {
      "@type": "Person", 
      "name": "Costa, Filippo"
    }, 
    {
      "@type": "Person", 
      "name": "Amabile, Claudio"
    }, 
    {
      "@type": "Person", 
      "name": "Monorchio, Agostino"
    }, 
    {
      "@type": "Person", 
      "name": "Prati, Enrico"
    }
  ], 
  "headline": "Waveguide Dielectric Permittivity Measurement Technique Based on Resonant FSS Filters", 
  "image": "https://zenodo.org/static/img/logos/zenodo-gradient-round.svg", 
  "datePublished": "2011-06-01", 
  "url": "https://zenodo.org/record/894374", 
  "@context": "https://schema.org/", 
  "identifier": "https://doi.org/10.1109/lmwc.2011.2122303", 
  "@id": "https://doi.org/10.1109/lmwc.2011.2122303", 
  "@type": "ScholarlyArticle", 
  "name": "Waveguide Dielectric Permittivity Measurement Technique Based on Resonant FSS Filters"
}