Journal article Open Access
Costa, Filippo; Amabile, Claudio; Monorchio, Agostino; Prati, Enrico
{ "description": "A method to determine the dielectric permittivity of materials is presented. Such a method exploits the use of a low-cost frequency selective structure (FSS), transversally placed in a waveguide in the proximity of the sample under test. The presence of the additional dielectric placed close to the FSS leads to a shift of bandpass and bandstop resonance frequencies. The relationship between the frequency shift and the permittivity of the dielectric under test allows the determination of the unknown permittivity. Such a procedure is particularly suitable for measuring the dielectric permittivity of thin slabs.", "license": "", "creator": [ { "@type": "Person", "name": "Costa, Filippo" }, { "@type": "Person", "name": "Amabile, Claudio" }, { "@type": "Person", "name": "Monorchio, Agostino" }, { "@type": "Person", "name": "Prati, Enrico" } ], "headline": "Waveguide Dielectric Permittivity Measurement Technique Based on Resonant FSS Filters", "image": "https://zenodo.org/static/img/logos/zenodo-gradient-round.svg", "datePublished": "2011-06-01", "url": "https://zenodo.org/record/894374", "@context": "https://schema.org/", "identifier": "https://doi.org/10.1109/lmwc.2011.2122303", "@id": "https://doi.org/10.1109/lmwc.2011.2122303", "@type": "ScholarlyArticle", "name": "Waveguide Dielectric Permittivity Measurement Technique Based on Resonant FSS Filters" }
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