Journal article Open Access
Costa, Filippo; Amabile, Claudio; Monorchio, Agostino; Prati, Enrico
<?xml version='1.0' encoding='utf-8'?> <resource xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://datacite.org/schema/kernel-4" xsi:schemaLocation="http://datacite.org/schema/kernel-4 http://schema.datacite.org/meta/kernel-4.1/metadata.xsd"> <identifier identifierType="URL">https://zenodo.org/record/894374</identifier> <creators> <creator> <creatorName>Costa, Filippo</creatorName> <givenName>Filippo</givenName> <familyName>Costa</familyName> </creator> <creator> <creatorName>Amabile, Claudio</creatorName> <givenName>Claudio</givenName> <familyName>Amabile</familyName> </creator> <creator> <creatorName>Monorchio, Agostino</creatorName> <givenName>Agostino</givenName> <familyName>Monorchio</familyName> </creator> <creator> <creatorName>Prati, Enrico</creatorName> <givenName>Enrico</givenName> <familyName>Prati</familyName> </creator> </creators> <titles> <title>Waveguide Dielectric Permittivity Measurement Technique Based on Resonant FSS Filters</title> </titles> <publisher>Zenodo</publisher> <publicationYear>2011</publicationYear> <dates> <date dateType="Issued">2011-06-01</date> </dates> <resourceType resourceTypeGeneral="Text">Journal article</resourceType> <alternateIdentifiers> <alternateIdentifier alternateIdentifierType="url">https://zenodo.org/record/894374</alternateIdentifier> </alternateIdentifiers> <relatedIdentifiers> <relatedIdentifier relatedIdentifierType="DOI" relationType="IsIdenticalTo">10.1109/lmwc.2011.2122303</relatedIdentifier> </relatedIdentifiers> <rightsList> <rights rightsURI="info:eu-repo/semantics/openAccess">Open Access</rights> </rightsList> <descriptions> <description descriptionType="Abstract">A method to determine the dielectric permittivity of materials is presented. Such a method exploits the use of a low-cost frequency selective structure (FSS), transversally placed in a waveguide in the proximity of the sample under test. The presence of the additional dielectric placed close to the FSS leads to a shift of bandpass and bandstop resonance frequencies. The relationship between the frequency shift and the permittivity of the dielectric under test allows the determination of the unknown permittivity. Such a procedure is particularly suitable for measuring the dielectric permittivity of thin slabs.</description> </descriptions> </resource>
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