June 1, 2011 Journal article Open Access

Costa, Filippo; Amabile, Claudio; Monorchio, Agostino; Prati, Enrico

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  <identifier identifierType="URL">https://zenodo.org/record/894374</identifier>
  <creators>
    <creator>
      <creatorName>Costa, Filippo</creatorName>
      <givenName>Filippo</givenName>
      <familyName>Costa</familyName>
    </creator>
    <creator>
      <creatorName>Amabile, Claudio</creatorName>
      <givenName>Claudio</givenName>
      <familyName>Amabile</familyName>
    </creator>
    <creator>
      <creatorName>Monorchio, Agostino</creatorName>
      <givenName>Agostino</givenName>
      <familyName>Monorchio</familyName>
    </creator>
    <creator>
      <creatorName>Prati, Enrico</creatorName>
      <givenName>Enrico</givenName>
      <familyName>Prati</familyName>
    </creator>
  </creators>
  <titles>
    <title>Waveguide Dielectric Permittivity Measurement Technique Based on Resonant FSS Filters</title>
  </titles>
  <publisher>Zenodo</publisher>
  <publicationYear>2011</publicationYear>
  <dates>
    <date dateType="Issued">2011-06-01</date>
  </dates>
  <resourceType resourceTypeGeneral="Text">Journal article</resourceType>
  <alternateIdentifiers>
    <alternateIdentifier alternateIdentifierType="url">https://zenodo.org/record/894374</alternateIdentifier>
  </alternateIdentifiers>
  <relatedIdentifiers>
    <relatedIdentifier relatedIdentifierType="DOI" relationType="IsIdenticalTo">10.1109/lmwc.2011.2122303</relatedIdentifier>
  </relatedIdentifiers>
  <rightsList>
    <rights rightsURI="info:eu-repo/semantics/openAccess">Open Access</rights>
  </rightsList>
  <descriptions>
    <description descriptionType="Abstract">A method to determine the dielectric permittivity of materials is presented. Such a method exploits the use of a low-cost frequency selective structure (FSS), transversally placed in a waveguide in the proximity of the sample under test. The presence of the additional dielectric placed close to the FSS leads to a shift of bandpass and bandstop resonance frequencies. The relationship between the frequency shift and the permittivity of the dielectric under test allows the determination of the unknown permittivity. Such a procedure is particularly suitable for measuring the dielectric permittivity of thin slabs.</description>
  </descriptions>
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