Dataset Open Access

Dependence of MeV TOF SIMS secondary molecular ion yield from phthalocyanine blue on primary ion stopping power

Brajkovic, Marko; Barac, Marko; Bogdanovic Radovic, Ivancica; Siketic, Zdravko

Time-of-flight Secondary Ion Mass Spectrometry (TOF SIMS) is a well-established mass spectrometry technique used for the chemical analysis of both organic and inorganic materials. In the last ten years, many advances have been made to improve the yield of secondary molecular ions, especially those desorbed from the surfaces of organic samples. For that, cluster ion beams with keV energies for the excitation were mostly used. Alternatively, single-ion beams with MeV energies can be applied, as done in the present work. It is well known that secondary molecular/ion yield depends strongly on the primary ion stopping power, but the nature of this dependence is not completely clear. Therefore, in the present work secondary ion yield from the phthalocyanine blue (C32H16CuN8, organic pigment) was measured for the various combinations of ion masses, energies and charge states. Measured values were compared with the existing models for ion sputtering. An increase of the secondary yield with the primary ion energy, electronic stopping, velocity and charge state was found for different types of primary ions. Although this general behavior is valid for all primary ions, there is no single parameter that can describe the measured results for all primary ions at once.  

- measured (calibrated) spectra are uploaded 



M. Brajković acknowledges support by the Croatian Science Foundation (CSF) project "Young Researchers' Career Development Project - Training of Doctoral Students" co-financed by the European Union, Operational Program "Efficient Human Resources 2014-2020" and the ESF. I. B. R. and Z. S. acknowledge support by the CSF project IP-2016-06-1698 "Development of a capillary microprobe for MeV SIMS for analysis of biological materials– BioCapSIMS", by the RADIATE project under the Grant Agreement 824096 from the EU Research and Innovation program HORIZON 2020 and by the Croatian Centre of Excellence for Advanced Materials and Sensing devices research unit Ion Beam Physics and Technology, Ruđer Bošković Institute, Zagreb, Croatia.
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