Patent Open Access

Intelligent adaptive x-ray imaging system (US 20080232550 A1)

I-ImaS Consortium


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{
  "DOI": "10.5281/zenodo.59594", 
  "abstract": "<p>Abstract</p>\n\n<p>A method and an arrangement for an intelligent adaptive x-ray imaging system, in which the exposure conditions of the object to x-rays is dynamically controlled and optimized in real-time in order to provide the optimum diagnostic information. The arrangement splits the imaging beam into two separate fan beams that scan over the object in a single pass, where the first beam (scout) collects information from the object, that is analyzed to control the intensity or spectral quality or spatial distribution of the second beam (I-ImaS). The CMOS image sensors deployed in the arrangement are able to process detected information either on-chip or within a field programmable gate array, so as to compute a measure related to the diagnostic value of the information.</p>", 
  "author": [
    {
      "family": "I-ImaS Consortium", 
      "given": ""
    }
  ], 
  "id": "59594", 
  "issued": {
    "date-parts": [
      [
        2016, 
        8, 
        4
      ]
    ]
  }, 
  "note": "For detailed references & citation see:\nhttps://www.google.com/patents/US20080232550", 
  "publisher": "Zenodo", 
  "title": "Intelligent adaptive x-ray imaging system (US 20080232550 A1)", 
  "type": "patent"
}
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