Journal article Open Access
Semiconductor Bearing Fault Recognition
Nikhita Mishra; Ipshitta Chaturvedi; Janhvi Mehta
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| Data volume | 15.3 MB |
| Unique views | 37 |
| Unique downloads | 22 |
Indexed in
- Publication date:
- October 30, 2021
- DOI:
-
- Keyword(s):
- semiconductor manufacturing, defective bearing, machine learning, deep learning.
- Subject(s):
- Published in:
- International Journal of Engineering and Advanced Technology (IJEAT): 11 pp. 21-26 (1).
- Related identifiers:
- Cited by
- 2249-8958 (ISSN) (Journal article)
- License (for files):
- Creative Commons Attribution 4.0 International