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Enhanced IEEE RTS-96 test case w/ synthesized dynamic parameters

Lassetter, Carter; Cotilla-Sanchez, Eduardo; Kim, Jinsub


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  <dc:creator>Lassetter, Carter</dc:creator>
  <dc:creator>Cotilla-Sanchez, Eduardo</dc:creator>
  <dc:creator>Kim, Jinsub</dc:creator>
  <dc:date>2016-05-05</dc:date>
  <dc:description>Enhanced IEEE RTS-96 test case w/ synthesized dynamic parameters
Compatible with Siemens PTI PSS/E v33, adapted from Grigg et al., 1999

Salient generator models
IEEE T1 exciter models
IEEE G2 governor models</dc:description>
  <dc:identifier>https://zenodo.org/record/51001</dc:identifier>
  <dc:identifier>10.5281/zenodo.51001</dc:identifier>
  <dc:identifier>oai:zenodo.org:51001</dc:identifier>
  <dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
  <dc:rights>https://opensource.org/licenses/GPL-3.0</dc:rights>
  <dc:title>Enhanced IEEE RTS-96 test case w/ synthesized dynamic parameters</dc:title>
  <dc:type>info:eu-repo/semantics/other</dc:type>
  <dc:type>dataset</dc:type>
</oai_dc:dc>
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