10.5281/zenodo.4760536
https://zenodo.org/records/4760536
oai:zenodo.org:4760536
Godboley, Sangharatna
Sangharatna
Godboley
0000-0002-6169-6334
National Institute of Technology Warangal India
Jaffar, Joxan
Joxan
Jaffar
0000-0001-9988-6144
National University of Singapore
Maghareh, Rasool
Rasool
Maghareh
0000-0002-8147-6590
Huawei Heterogeneous Compiler Lab Toronto Canada
Dutta, Arpita
Arpita
Dutta
0000-0001-7887-3264
National University of Singapore
CUSTOM-Interpolation: ISSTA artifact evaluation
Zenodo
2021
Software Testing, MC/DC Testing, Symbolic Execution
Godboley, Sangharatna
Sangharatna
Godboley
0000-0002-6169-6334
National Institute of Technology Warangal India
Jaffar, Joxan
Joxan
Jaffar
0000-0001-9988-6144
National University of Singapore
Maghareh, Rasool
Rasool
Maghareh
0000-0002-8147-6590
Huawei Heterogeneous Compiler Lab Toronto Canada
Dutta, Arpita
Arpita
Dutta
0000-0001-7887-3264
National University of Singapore
2021-04-30
10.5281/zenodo.4729426
2.0
Creative Commons Attribution 4.0 International
This artifact is prepared to regenerate the results for the paper titled "Toward Optimal MC/DC Test Case Generation", ISSTA-2021. Also, this contains all the raw experimental results.
This work is a part of the project TracerX (https://tracer-x.github.io/).