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Test-Generation Methods

Wolff, Burkhart; Nemouchi, Yakoub; Feliachi, Abderrahmane; Tverdyshev, Sergey; Havle, Oto; Blasum, Holger; Langenstein, Bruno; Stephan, Werner; Proch, Cyril; Verbeek, Freek; Schmaltz, Julien

This document consists of four parts:

  • Part I gives an overview over formal automated test-generation techniques developed in the EURO-MILS project. This contains a chapter on new methodologies as well as a chapter on implemented  techniques in HOL-TestGen.
  • Part II develops the main approach of concurrent code-testing supported by HOL-TestGen, presented at an academic example called MyKeOS.
  • Part III develops the main case-study on test-case generation for the IPC protocol, which is run against a PikeOS demonstrator.
  • Part IV comprises a collection of technical annexes: a) the current HOL-TestGen Reference Manual, b) the Test Theory for the IPC protocol, c) the code for Test Execution Adapters and  d) the code for the PiKeOS demonstrator.


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