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Improving GPU Register File Reliability with a comprehensive ISA extension

Rodriguez Condia, Josie Esteban; Goncalves, Marcio; Azambuja, Jose Rodrigo; Sonza Reorda, Matteo; Sterpone, Luca


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      <creatorName>Rodriguez Condia, Josie Esteban</creatorName>
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      <affiliation>Politecnico di Torino</affiliation>
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      <creatorName>Goncalves, Marcio</creatorName>
      <givenName>Marcio</givenName>
      <familyName>Goncalves</familyName>
      <affiliation>Federal University of Rio Grande do Sul</affiliation>
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    <creator>
      <creatorName>Azambuja, Jose Rodrigo</creatorName>
      <givenName>Jose Rodrigo</givenName>
      <familyName>Azambuja</familyName>
      <affiliation>Federal University of Rio Grande do Sul</affiliation>
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    <creator>
      <creatorName>Sonza Reorda, Matteo</creatorName>
      <givenName>Matteo</givenName>
      <familyName>Sonza Reorda</familyName>
      <affiliation>Politecnico di Torino</affiliation>
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    <creator>
      <creatorName>Sterpone, Luca</creatorName>
      <givenName>Luca</givenName>
      <familyName>Sterpone</familyName>
      <affiliation>Politecnico di Torino</affiliation>
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  <titles>
    <title>Improving GPU Register File Reliability with a comprehensive ISA extension</title>
  </titles>
  <publisher>Zenodo</publisher>
  <publicationYear>2020</publicationYear>
  <subjects>
    <subject>GPUs</subject>
    <subject>In-field hardening</subject>
    <subject>software-based hardening</subject>
  </subjects>
  <dates>
    <date dateType="Issued">2020-11-10</date>
  </dates>
  <language>en</language>
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  <descriptions>
    <description descriptionType="Abstract">&lt;p&gt;Preprint version of the manuscript presented at&amp;nbsp;31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF2020) and later published at&amp;nbsp;Microelectronics Reliability, Elsevier, Volume 114, November 2020, 113768.&lt;/p&gt;

&lt;p&gt;&amp;nbsp;&lt;/p&gt;</description>
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      <funderName>European Commission</funderName>
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      <awardNumber awardURI="info:eu-repo/grantAgreement/EC/H2020/722325/">722325</awardNumber>
      <awardTitle>Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems Design</awardTitle>
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