4662623
doi
10.5281/zenodo.4662623
oai:zenodo.org:4662623
user-eu
Sonza Reorda, Matteo
Politecnico di Torino
An extended GPGPU model to support detailed reliability analysis
Rodriguez Condia, Josie Esteban
Politecnico di Torino
info:eu-repo/semantics/openAccess
Creative Commons Attribution 4.0 International
https://creativecommons.org/licenses/by/4.0/legalcode
GPUs
In-field testing
SBST
reliability evaluation
<p>Workshop paper presented at the SELSE-15: The 15th Workshop on Silicon Errors in Logic – System Effects, Stanford University, USA, 27-28 March 2019.</p>
Zenodo
2019-03-28
info:eu-repo/semantics/article
4662622
user-eu
1.0
award_title=Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems Design; award_number=722325; award_identifiers_scheme=url; award_identifiers_identifier=https://cordis.europa.eu/projects/722325; funder_id=00k4n6c32; funder_name=European Commission;
1617625638.469072
680746
md5:ac6f3de43ec2f29bc8cc1069736f23f4
https://zenodo.org/records/4662623/files/23-SELSE19.pdf
public
10.5281/zenodo.4662622
isVersionOf
doi