4662598
doi
10.5281/zenodo.4662598
oai:zenodo.org:4662598
user-eu
IN-FIELD GPGPU TEST WITH SBST TECHNIQUES
Rodriguez Condia, Josie Esteban
Politecnico di Torino
info:eu-repo/semantics/openAccess
Creative Commons Attribution 4.0 International
https://creativecommons.org/licenses/by/4.0/legalcode
GPUs
In-field testing
SBST
testing
Fault-Tolerance
<p>Research Poster presented at the GTC 2018 conference, Munich, Germany.</p>
Zenodo
2021-04-05
info:eu-repo/semantics/conferencePoster
4662597
user-eu
1.0
award_title=Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems Design; award_number=722325; award_identifiers_scheme=url; award_identifiers_identifier=https://cordis.europa.eu/projects/722325; funder_id=00k4n6c32; funder_name=European Commission;
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md5:1b6bced9837f9fd02ba1b96bf65561fb
https://zenodo.org/records/4662598/files/03-GTC19.pdf
public
10.5281/zenodo.4662597
isVersionOf
doi