4587989
doi
10.5281/zenodo.4587989
oai:zenodo.org:4587989
user-eu
Guilherme Cardoso Medeiros
Delft University of Technology
Junchao Chen
Innovations for High Performance Microelectronics (IHP)
Josie Esteban Rodriguez Conda
Politecnico di Torino
Thomas Lange
IROC Technologies
Aleksa Damljanovic
Politecnico di Torino
Raphael Segabinazzi Ferreira
Brandenburg University of Technology Cottbus-Senftenberg
Aneesh Balakrishnan
IROC Technologies
Xinhui (Anna) Lai
Tallinn University of Technology
Shayesteh Masoumian
Intrinsic ID
Dmytro Petryk
Innovations for High Performance Microelectronics (IHP)
Troya Cagil Koylu
Delft University of Technology
Felipe Augusto da Silva
Cadence Design Systems GmbH
Ahmet Cagri Bagbaba
Cadence Design Systems GmbH
Cemil Cem Gürsoy
Tallinn University of Technology
Said Hamdioui
Delft University of Technology
Mottaqiallah Taouil
Delft University of Technology
Milos Krstic
Innovations for High Performance Microelectronics (IHP)
Peter Langendoerfer
Innovations for High Performance Microelectronics (IHP)
Zoya Dyka
Innovations for High Performance Microelectronics (IHP)
Marcelo Brandalero
Brandenburg University of Technology Cottbus-Senftenberg
Michael Hübner
Brandenburg University of Technology Cottbus-Senftenberg
Jörg Nolte
Brandenburg University of Technology Cottbus-Senftenberg
Heinrich Theodor Vierhaus
Brandenburg University of Technology Cottbus-Senftenberg
Matteo Sonza Reord
Politecnico di Torino
Giovanni Squillero
Politecnico di Torino
Luca Sterpone
Politecnico di Torino
Jaan Raik
Tallinn University of Technology
Dan Alexandrescu
IROC Technologies
Maximilien Glorieux
IROC Technologies
Georgios Selimis
Intrinsic ID
Geert-Jan Schrijen
Intrinsic ID
Anton Klotz
Cadence Design Systems GmbH
Christian Sauer
Cadence Design Systems GmbH
Maksim Jenihhin
Tallinn University of Technology
A Rescue Demonstrator for Interdependent Aspects of Reliability, Security and Quality Towards a Complete EDA Flow
Nevin George
Brandenburg University of Technology Cottbus-Senftenberg
info:eu-repo/semantics/openAccess
Creative Commons Attribution 4.0 International
https://creativecommons.org/licenses/by/4.0/legalcode
Reliability
Security
Quality
Fault-Tolerance
EDA tools
nanoeletronic systems design
<p>The demonstrator highlights the various interdependent aspects of Reliability, Security and Quality in nanoelectronics system design within an EDA toolset and a processor architecture setup. The compelling need of attention towards these three aspects of nanoelectonic systems have been ever more pronounced over extreme miniaturization of technologies. Further, such systems have exploded in numbers with IoT devices, heavy and analogous interaction with the external physical world, complex safety-critical applications, and Artificial intelligence applications. RESCUE targets such aspects in the form, Reliability (functional safety, ageing, soft errors), Security (tamper-resistance, PUF technology, intelligent security) and Quality (novel fault models, functional test, FMEA/FMECA, verification/debug) spanning the entire hardware software system stack. The demonstrator is brought together by a group of PhD students under the banner of H2020-MSCA-ITN RESCUE EU project. They are part of a larger interdisciplinary cross-sectoral team from Tallinn UT, TU Delft, BTU Cottbus, POLITO, IHP, IROC, Intrinsic-ID, Cadence and Bosch who collaborate on a holistic solution for modelling, assessment and enhancement of these extra functional design aspects.</p>
Zenodo
2020-03-12
info:eu-repo/semantics/other
4587988
user-eu
1
award_title=Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems Design; award_number=722325; award_identifiers_scheme=url; award_identifiers_identifier=https://cordis.europa.eu/projects/722325; funder_id=00k4n6c32; funder_name=European Commission;
1615163240.443578
178025
md5:f76ed7ebb819e4865f79b7960004e2b7
https://zenodo.org/records/4587989/files/University_Booth_RESCUE_2020.pdf
public
10.5281/zenodo.4587988
isVersionOf
doi