Nevin George
Guilherme Cardoso Medeiros
Junchao Chen
Josie Esteban Rodriguez Conda
Thomas Lange
Aleksa Damljanovic
Raphael Segabinazzi Ferreira
Aneesh Balakrishnan
Xinhui (Anna) Lai
Shayesteh Masoumian
Dmytro Petryk
Troya Cagil Koylu
Felipe Augusto da Silva
Ahmet Cagri Bagbaba
Cemil Cem Gürsoy
Said Hamdioui
Mottaqiallah Taouil
Milos Krstic
Peter Langendoerfer
Zoya Dyka
Marcelo Brandalero
Michael Hübner
Jörg Nolte
Heinrich Theodor Vierhaus
Matteo Sonza Reord
Giovanni Squillero
Luca Sterpone
Jaan Raik
Dan Alexandrescu
Maximilien Glorieux
Georgios Selimis
Geert-Jan Schrijen
Anton Klotz
Christian Sauer
Maksim Jenihhin
2020-03-12
<p>The demonstrator highlights the various interdependent aspects of Reliability, Security and Quality in nanoelectronics system design within an EDA toolset and a processor architecture setup. The compelling need of attention towards these three aspects of nanoelectonic systems have been ever more pronounced over extreme miniaturization of technologies. Further, such systems have exploded in numbers with IoT devices, heavy and analogous interaction with the external physical world, complex safety-critical applications, and Artificial intelligence applications. RESCUE targets such aspects in the form, Reliability (functional safety, ageing, soft errors), Security (tamper-resistance, PUF technology, intelligent security) and Quality (novel fault models, functional test, FMEA/FMECA, verification/debug) spanning the entire hardware software system stack. The demonstrator is brought together by a group of PhD students under the banner of H2020-MSCA-ITN RESCUE EU project. They are part of a larger interdisciplinary cross-sectoral team from Tallinn UT, TU Delft, BTU Cottbus, POLITO, IHP, IROC, Intrinsic-ID, Cadence and Bosch who collaborate on a holistic solution for modelling, assessment and enhancement of these extra functional design aspects.</p>
https://doi.org/10.5281/zenodo.4587989
oai:zenodo.org:4587989
Zenodo
https://zenodo.org/communities/eu
https://doi.org/10.5281/zenodo.4587988
info:eu-repo/semantics/openAccess
Creative Commons Attribution 4.0 International
https://creativecommons.org/licenses/by/4.0/legalcode
DATE 2020, Design, Automation and Test in Europe Conference, Virtual Conference and Exhibition, 21 April – 30 June 2020
Reliability
Security
Quality
Fault-Tolerance
EDA tools
nanoeletronic systems design
A Rescue Demonstrator for Interdependent Aspects of Reliability, Security and Quality Towards a Complete EDA Flow
info:eu-repo/semantics/other