4545664
doi
10.1109/ISVLSI49217.2020.00076
oai:zenodo.org:4545664
user-eu
Goncalves, Marcio M.
Federal University of Rio Grande do Sul
Azambuja, Jose Rodrigo
Federal University of Rio Grande do Sul
Sonza Reorda, Matteo
Politecnico di Torino
Sterpone, Luca
Politecnico di Torino
Analyzing the Sensitivity of GPU Pipeline Registers to Single Events Upsets
Rodriguez Condia, Josie Esteban
Politecnico di Torino
info:eu-repo/semantics/openAccess
Creative Commons Attribution 4.0 International
https://creativecommons.org/licenses/by/4.0/legalcode
Fault tolerance
graphics processing units
pipeline registers
single event upsets
<p>Open access version of the manuscript presented at the ISVLSI2020 conference</p>
Zenodo
2020-08-04
info:eu-repo/semantics/conferencePaper
4545663
user-eu
1
award_title=Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems Design; award_number=722325; award_identifiers_scheme=url; award_identifiers_identifier=https://cordis.europa.eu/projects/722325; funder_id=00k4n6c32; funder_name=European Commission;
1613608043.900968
1813405
md5:c02af46aea35210f62aa465913922863
https://zenodo.org/records/4545664/files/paper_open_access.pdf
public