Published February 2, 2021
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Higher-Mode Contact Resonance Operation of a High-Aspect- Ratio Piezoresistive Cantilever Microprobe (Data)
Creators
- 1. TU Braunschweig, Institute of Semiconductor Technology (IHT)
Description
Raw data, Ansys Workbench Projects and figures used for the article "Higher-Mode Contact Resonance Operation of a High-Aspect- Ratio Piezoresistive Cantilever Microprobe", published in the proceedings of SMSI 2020, which did not take place because of Covid-19 virus pandemic.
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Files
Data.zip
Files
(7.7 MB)
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Additional details
Related works
- Is supplement to
- Conference paper: 10.5162/SMSI2020/A6.3 (DOI)