Journal article Open Access
Liu, Shuping; Fossati, Alexandre; Serrano, Diana; Tallaire, Alexandre; Ferrier, Alban; Goldner, Philippe
{ "DOI": "10.1021/acsnano.0c02971", "author": [ { "family": "Liu, Shuping" }, { "family": "Fossati, Alexandre" }, { "family": "Serrano, Diana" }, { "family": "Tallaire, Alexandre" }, { "family": "Ferrier, Alban" }, { "family": "Goldner, Philippe" } ], "issued": { "date-parts": [ [ 2020, 7, 22 ] ] }, "abstract": "<p>Nanostructured systems that combine optical and spin transitions offer new functionalities for quantum technologies by providing efficient quantum light–matter interfaces. Rare-earth (RE) ion-doped nanoparticles are promising in this field as they show long-lived optical and spin quantum states. However, further development of their use in highly demanding applications, such as scalable single-ion-based quantum processors, requires controlling defects that currently limit coherence lifetimes. In this work, we show that a post-treatment process that includes multistep high-temperature annealing followed by high-power microwave oxygen plasma processing advantageously improves key properties for quantum technologies. We obtain single crystalline Eu<sup>3+</sup>:Y<sub>2</sub>O<sub>3</sub> nanoparticles (NPs) of 100 nm diameter, presenting bulk-like inhomogeneous line widths (Γ<sub>inh</sub>) and population lifetimes (<em>T</em><sub>1</sub>). Furthermore, a significant coherence lifetime (<em>T</em><sub>2</sub>) extension, up to a factor of 5, is successfully achieved by modifying the oxygen-related point defects in the NPs by the oxygen plasma treatment. These promising results confirm the potential of engineered RE NPs to integrate devices such as cavity-based single-photon sources, quantum memories, and processors. In addition, our strategy could be applied to a large variety of oxides to obtain outstanding crystalline quality NPs for a broad range of applications.</p>", "title": "Defect Engineering for Quantum Grade Rare-Earth Nanocrystals", "version": "1", "type": "article-journal", "id": "4081028" }
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