Journal article Open Access

Wafer-scale graphene quality assessment using micro four-point probe mapping

Mackenzie, D.; Kalhauge, K.; Whelan, P.; Østergaard, F.; Pasternak, I.; Strupinski, W.; Bøggild, P.; Jepsen, P.; Petersen, D.


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@article{mackenzie_d_2020_3947967,
  author       = {Mackenzie, D. and
                  Kalhauge, K. and
                  Whelan, P. and
                  Østergaard, F. and
                  Pasternak, I. and
                  Strupinski, W. and
                  Bøggild, P. and
                  Jepsen, P. and
                  Petersen, D.},
  title        = {{Wafer-scale graphene quality assessment using 
                   micro four-point probe mapping}},
  journal      = {Nanotechnology},
  year         = 2020,
  number       = 31,
  month        = mar,
  doi          = {10.1088/1361-6528/ab7677},
  url          = {https://doi.org/10.1088/1361-6528/ab7677}
}
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