Conference paper Open Access

A Robust Measurement Method for Supraharmonics Under Power Frequency Deviations

Stefano Lodetti; Victor Khokhlov; Jan Meyer; Jorge Bruna; Julio J. Melero

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<oai_dc:dc xmlns:dc="" xmlns:oai_dc="" xmlns:xsi="" xsi:schemaLocation="">
  <dc:creator>Stefano Lodetti</dc:creator>
  <dc:creator>Victor Khokhlov</dc:creator>
  <dc:creator>Jan Meyer</dc:creator>
  <dc:creator>Jorge Bruna</dc:creator>
  <dc:creator>Julio J. Melero</dc:creator>
  <dc:description>Abstract—This paper introduces a new measurement method for supraharmonic distortion with improved robustness against power frequency deviations. The proposed method is based on wavelet analysis and it is designed to analyze a 10 cycles measurement interval. Fourier-based methods, instead, must analyze a fixed 200 ms window in order to avoid apparent shifts of the supraharmonic frequency components. The results of the experimental measurements presented in the paper show that the Fourier-based method suggested in IEC 61000-4-7 standard produces results affected by the value of the power frequency. The proposed method, instead, provides results completely inde- pendent of the power frequency. This feature also removes the need of a previous high pass filtering stage, required for the IEC method. Moreover, the proposed method has the additional advantage of working on the same measurement interval as traditional harmonics (below 2 kHz), feature that can reduce the complexity of measurement instruments.</dc:description>
  <dc:subject>High frequency distortion, power quality, supra- harmonics, measurement techniques, voltage distortion</dc:subject>
  <dc:title>A Robust Measurement Method for Supraharmonics Under Power Frequency Deviations</dc:title>
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