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Insights into image contrast from dislocations in ADF-STEM

Oveisi, E; Spadaro, M.C.; Rotunno, Enzo; Grillo, Vincenzo; Hébert, C


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  <dc:creator>Oveisi, E</dc:creator>
  <dc:creator>Spadaro, M.C.</dc:creator>
  <dc:creator>Rotunno, Enzo</dc:creator>
  <dc:creator>Grillo, Vincenzo</dc:creator>
  <dc:creator>Hébert, C</dc:creator>
  <dc:date>2020-05-20</dc:date>
  <dc:description>Competitive mechanisms contribute to image contrast from dislocations in annular dark-field scanning transmission electron microscopy (ADF-STEM). A clear theoretical understanding of the mechanisms underlying the ADF-STEM contrast is therefore essential for correct interpretation of dislocation images. This paper reports on a systematic study of the ADF-STEM contrast from dislocations in a GaN specimen, both experimentally and computationally. Systematic experimental ADF-STEM images of the edge-character dislocations reveal a number of characteristic contrast features that are shown to depend on both the angular detection range and specific position of the dislocation in the sample. A theoretical model based on electron channelling and Bloch-wave scattering theories, supported by numerical simulations based on Grillo's strain-channelling equation, is proposed to elucidate the physical origin of such complex contrast phenomena.</dc:description>
  <dc:identifier>https://zenodo.org/record/3836149</dc:identifier>
  <dc:identifier>10.1016/j.ultramic.2019.02.004</dc:identifier>
  <dc:identifier>oai:zenodo.org:3836149</dc:identifier>
  <dc:relation>info:eu-repo/grantAgreement/EC/H2020/766970/</dc:relation>
  <dc:relation>url:https://zenodo.org/communities/qsort</dc:relation>
  <dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
  <dc:rights>https://creativecommons.org/licenses/by/4.0/legalcode</dc:rights>
  <dc:title>Insights into image contrast from dislocations in ADF-STEM</dc:title>
  <dc:type>info:eu-repo/semantics/preprint</dc:type>
  <dc:type>publication-preprint</dc:type>
</oai_dc:dc>
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