Scanning electron microscope images

Microscopic images of discrete samples were acquired using a scanning electron microscope (SEM) and captured as image files. These files were uploaded along with a brief description and a record of the microscopic conditions when the image was taken.

Data File format

	Exp: expedition number
	Site: site number
	Hole: hole number
	Core: core number
	Type: type indicates the coring tool used to recover the core (typical types are F, H, R, X).
	Sect: section number
	A/W: archive (A) or working (W) section half.
	Top offset (cm): position of the upper edge of the image, measured relative to the top of the section.
	Bottom offset (cm): position of the lower edge of the image, measured relative to the bottom of the section.
	Top depth CSF-A (m): location of the upper edge of the image expressed relative to the top of the hole.
	Bottom depth CSF-A (m): location of the lower edge of the image expressed relative to the top of the hole.
	Top depth CSF-B (m): location of the upper edge of the image expressed relative to the top of the hole.
	Bottom depth CSF-B (m): location of the lower edge of the image expressed relative to the top of the hole.
	Image filename: filename of SEM TIF image.
	Text filename: text file containing SEM experiment metadata.
	Category: category of the specimen pictured in the image (e.g., fossil, structure, composition).
	Observable: description of pictured specimen.
	Magnification: magnification setting on the SEM when the picture was taken.
	Timestamp (UTC): point in time at which an observation or set of observations were made.
	Instrument: SEM (currently Hitachi TM3000).
	Text ID: automatically generated unique database identifier for a sample, visible on printed labels.
	Comments: uploader's notes about the sample or image or specimen on the image.