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Dataset Open Access

IODP Expedition 362 X-ray diffraction (XRD)

McNeill, L.C.; Dugan, B.; Petronotis, K.E.; Backman, J.; Bourlange, S.; Chemale, F.; Chen, W.; Colson, T.A.; Frederik, M.C.G.; Guèrin, G.; Hamahashi, M.; Henstock, T.; House, B.M.; Hüpers, A.; Jeppson, T.N.; Kachovich, S.; Kenigsberg, A.R.; Kuranaga, M.; Kutterolf, S.; Milliken, K.L.; Mitchison, F.L.; Mukoyoshi, H.; Nair, N.; Owari, S.; Pickering, K.T.; Pouderoux, H.F.A.; Shan, Y.; Song, I.; Torres, M.E.; Vannucchi, P.; Vrolijk, P.J.; Yang, T.; Zhao, X.

Data collector(s)
International Ocean Discovery Program

X-ray diffraction (XRD) is used to identify minerals and their proportions in sediment or hard rock sample powders on a Bruker AXS D4 Endeavor X-ray diffractometer. Results are returned as diffractograms in a viewable format (either PDF or PNG).

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362-XRD.zip
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