Conference paper Open Access

RESCUE EDA Toolset for Interdependent Aspects of Reliability, Security and Quality in Nanoelectronic Systems Design

Cemil Cem Gursoy; Guilherme Medeiros; Junchao Chen; Nevin George; Josie Esteban Rodriguez Condia; Thomas Lange; Aleksa Damljanovic; Raphael Segabinazzi Ferreira; Aneesh Balakrishnan; Xinhui Anna Lai; Shayesteh Masoumian; Dmytro Petryk; Troya Cagil Koylu; Felipe Augusto da Silva; Ahmet Cagri Bagbaba; Said Hamdioui; Motaguillah Taouil; Milos Krstic; Peter Langendoerfer; Zoya Dyka; Michael Huebner; Joerg Nolte; Heinrich Thoodor Vierhaus; Matteo Sonza Reorda; Giovanni Squillero; Luca Sterpone; Jaan Raik; Dan Alexandrescu; Maximilien Glorieux; Georgis Selimis; Gert-Jan Schrijen; Anton Klotz; Christian Sauer; Maksim Jenihhin


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    <subfield code="a">Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems Design</subfield>
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    <subfield code="a">&lt;p&gt;The demonstrator introduces an EDA toolset developed by a team of PhD students in the H2020-MSCA-ITN RESCUE project.&lt;/p&gt;

&lt;p&gt;The recent trends for the nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT), complex safety-critical applications, extreme miniaturization of implementation technologies and intensive interaction with the physical world. These trends set tough requirements on mutually dependent extra-functional design aspects. RESCUE is focused on the key challenges for reliability (functional safety, fault management mechanisms, BTI ageing, soft errors), security (tamper-resistance, PUF technology, intelligent security) and quality (novel fault models in FinFET, functional test, FMEA/FMECA, verification and debug techniques) and related EDA methodologies. The objective of the interdisciplinary cross-sectoral team is to develop in collaboration a holistic EDA Toolset for modelling, assessment and enhancement of these extra-functional design aspects.&lt;/p&gt;</subfield>
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