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RESCUE EDA Toolset for Interdependent Aspects of Reliability, Security and Quality in Nanoelectronic Systems Design

Cemil Cem Gursoy; Guilherme Medeiros; Junchao Chen; Nevin George; Josie Esteban Rodriguez Condia; Thomas Lange; Aleksa Damljanovic; Raphael Segabinazzi Ferreira; Aneesh Balakrishnan; Xinhui Anna Lai; Shayesteh Masoumian; Dmytro Petryk; Troya Cagil Koylu; Felipe Augusto da Silva; Ahmet Cagri Bagbaba; Said Hamdioui; Motaguillah Taouil; Milos Krstic; Peter Langendoerfer; Zoya Dyka; Michael Huebner; Joerg Nolte; Heinrich Thoodor Vierhaus; Matteo Sonza Reorda; Giovanni Squillero; Luca Sterpone; Jaan Raik; Dan Alexandrescu; Maximilien Glorieux; Georgis Selimis; Gert-Jan Schrijen; Anton Klotz; Christian Sauer; Maksim Jenihhin


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{
  "files": [
    {
      "links": {
        "self": "https://zenodo.org/api/files/e18b1edd-fa6b-426a-8f91-3e960f2b8c02/41835.pdf"
      }, 
      "checksum": "md5:9a69e76bc145b2668221b9627ed5bbda", 
      "bucket": "e18b1edd-fa6b-426a-8f91-3e960f2b8c02", 
      "key": "41835.pdf", 
      "type": "pdf", 
      "size": 237545
    }
  ], 
  "owners": [
    73318
  ], 
  "doi": "10.5281/zenodo.3362529", 
  "stats": {
    "version_unique_downloads": 25.0, 
    "unique_views": 25.0, 
    "views": 26.0, 
    "downloads": 28.0, 
    "unique_downloads": 25.0, 
    "version_unique_views": 25.0, 
    "volume": 6651260.0, 
    "version_downloads": 28.0, 
    "version_views": 26.0, 
    "version_volume": 6651260.0
  }, 
  "links": {
    "doi": "https://doi.org/10.5281/zenodo.3362529", 
    "conceptdoi": "https://doi.org/10.5281/zenodo.3362528", 
    "bucket": "https://zenodo.org/api/files/e18b1edd-fa6b-426a-8f91-3e960f2b8c02", 
    "conceptbadge": "https://zenodo.org/badge/doi/10.5281/zenodo.3362528.svg", 
    "html": "https://zenodo.org/record/3362529", 
    "latest_html": "https://zenodo.org/record/3362529", 
    "badge": "https://zenodo.org/badge/doi/10.5281/zenodo.3362529.svg", 
    "latest": "https://zenodo.org/api/records/3362529"
  }, 
  "conceptdoi": "10.5281/zenodo.3362528", 
  "created": "2019-08-07T19:32:54.830503+00:00", 
  "updated": "2019-11-01T19:12:54.439935+00:00", 
  "conceptrecid": "3362528", 
  "revision": 4, 
  "id": 3362529, 
  "metadata": {
    "access_right_category": "success", 
    "doi": "10.5281/zenodo.3362529", 
    "description": "<p>The demonstrator introduces an EDA toolset developed by a team of PhD students in the H2020-MSCA-ITN RESCUE project.</p>\n\n<p>The recent trends for the nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT), complex safety-critical applications, extreme miniaturization of implementation technologies and intensive interaction with the physical world. These trends set tough requirements on mutually dependent extra-functional design aspects. RESCUE is focused on the key challenges for reliability (functional safety, fault management mechanisms, BTI ageing, soft errors), security (tamper-resistance, PUF technology, intelligent security) and quality (novel fault models in FinFET, functional test, FMEA/FMECA, verification and debug techniques) and related EDA methodologies. The objective of the interdisciplinary cross-sectoral team is to develop in collaboration a holistic EDA Toolset for modelling, assessment and enhancement of these extra-functional design aspects.</p>", 
    "language": "eng", 
    "title": "RESCUE EDA Toolset for Interdependent Aspects of Reliability, Security and Quality in Nanoelectronic Systems Design", 
    "license": {
      "id": "CC-BY-4.0"
    }, 
    "relations": {
      "version": [
        {
          "count": 1, 
          "index": 0, 
          "parent": {
            "pid_type": "recid", 
            "pid_value": "3362528"
          }, 
          "is_last": true, 
          "last_child": {
            "pid_type": "recid", 
            "pid_value": "3362529"
          }
        }
      ]
    }, 
    "grants": [
      {
        "code": "722325", 
        "links": {
          "self": "https://zenodo.org/api/grants/10.13039/501100000780::722325"
        }, 
        "title": "Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems Design", 
        "acronym": "RESCUE", 
        "program": "H2020", 
        "funder": {
          "doi": "10.13039/501100000780", 
          "acronyms": [
            "EC"
          ], 
          "name": "European Commission", 
          "links": {
            "self": "https://zenodo.org/api/funders/10.13039/501100000780"
          }
        }
      }
    ], 
    "keywords": [
      "reliability, security, verification, test, fault tolerance, EDA tools, nanoelectronic systems design, H2020 MSCA ITN"
    ], 
    "publication_date": "2019-03-28", 
    "creators": [
      {
        "affiliation": "Tallinn University of Technology, Estonia", 
        "name": "Cemil Cem Gursoy"
      }, 
      {
        "affiliation": "Delft University of Technology, The Netherlands", 
        "name": "Guilherme Medeiros"
      }, 
      {
        "affiliation": "IHP, Germany", 
        "name": "Junchao Chen"
      }, 
      {
        "affiliation": "Brandenburg University of Technology, Germany", 
        "name": "Nevin George"
      }, 
      {
        "affiliation": "Politecnico di Torino, Italy", 
        "name": "Josie Esteban Rodriguez Condia"
      }, 
      {
        "affiliation": "IROC Technologies, France", 
        "name": "Thomas Lange"
      }, 
      {
        "affiliation": "5Politecnico di Torino", 
        "name": "Aleksa Damljanovic"
      }, 
      {
        "affiliation": "Brandenburg University of Technology, Germany", 
        "name": "Raphael Segabinazzi Ferreira"
      }, 
      {
        "affiliation": "IROC Technologies, France", 
        "name": "Aneesh Balakrishnan"
      }, 
      {
        "affiliation": "Tallinn University of Technology, Estonia", 
        "name": "Xinhui Anna Lai"
      }, 
      {
        "affiliation": "Intrinsic ID, The Netherlands", 
        "name": "Shayesteh Masoumian"
      }, 
      {
        "affiliation": "IHP, Germany", 
        "name": "Dmytro Petryk"
      }, 
      {
        "affiliation": "Delft University of Technology, The Netherlands", 
        "name": "Troya Cagil Koylu"
      }, 
      {
        "affiliation": "Cadence Design Systems, Germany", 
        "name": "Felipe Augusto da Silva"
      }, 
      {
        "affiliation": "Cadence Design Systems, Germany", 
        "name": "Ahmet Cagri Bagbaba"
      }, 
      {
        "affiliation": "Delft University of Technology, The Netherlands", 
        "name": "Said Hamdioui"
      }, 
      {
        "affiliation": "Delft University of Technology, The Netherlands", 
        "name": "Motaguillah Taouil"
      }, 
      {
        "affiliation": "IHP, Germany", 
        "name": "Milos Krstic"
      }, 
      {
        "affiliation": "IHP, Germany", 
        "name": "Peter Langendoerfer"
      }, 
      {
        "affiliation": "IHP, Germany", 
        "name": "Zoya Dyka"
      }, 
      {
        "affiliation": "Brandenburg University of Technology, Germany", 
        "name": "Michael Huebner"
      }, 
      {
        "affiliation": "Brandenburg University of Technology, Germany", 
        "name": "Joerg Nolte"
      }, 
      {
        "affiliation": "Brandenburg University of Technology, Germany", 
        "name": "Heinrich Thoodor Vierhaus"
      }, 
      {
        "affiliation": "5Politecnico di Torino", 
        "name": "Matteo Sonza Reorda"
      }, 
      {
        "affiliation": "5Politecnico di Torino", 
        "name": "Giovanni Squillero"
      }, 
      {
        "affiliation": "5Politecnico di Torino", 
        "name": "Luca Sterpone"
      }, 
      {
        "affiliation": "Tallinn University of Technology, Estonia", 
        "name": "Jaan Raik"
      }, 
      {
        "affiliation": "IROC Technologies, France", 
        "name": "Dan Alexandrescu"
      }, 
      {
        "affiliation": "IROC Technologies, France", 
        "name": "Maximilien Glorieux"
      }, 
      {
        "affiliation": "Intrinsic ID, The Netherlands", 
        "name": "Georgis Selimis"
      }, 
      {
        "affiliation": "Intrinsic ID, The Netherlands", 
        "name": "Gert-Jan Schrijen"
      }, 
      {
        "affiliation": "Cadence Design Systems, Germany", 
        "name": "Anton Klotz"
      }, 
      {
        "affiliation": "Cadence Design Systems, Germany", 
        "name": "Christian Sauer"
      }, 
      {
        "affiliation": "Tallinn University of Technology, Estonia", 
        "name": "Maksim Jenihhin"
      }
    ], 
    "meeting": {
      "dates": "25-29 March, 2019", 
      "title": "2019 University Booth, Design Automation and Test in Europe Conference", 
      "acronym": "UB DATE", 
      "url": "https://past.date-conference.com/conference/session/UB09", 
      "session": "UB09", 
      "place": "Florence, Italy"
    }, 
    "access_right": "open", 
    "resource_type": {
      "subtype": "conferencepaper", 
      "type": "publication", 
      "title": "Conference paper"
    }, 
    "related_identifiers": [
      {
        "scheme": "doi", 
        "identifier": "10.5281/zenodo.3362528", 
        "relation": "isVersionOf"
      }
    ]
  }
}
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