Conference paper Open Access
Sterpone, Luca;
Azimi, Sarah;
Bozzoli, Ludovica;
Du, Boyang;
Lange, Thomas;
Glorieux, Maximilien;
Alexandrescu, Dan;
Polo, Cesar Boatella;
Codinachs, David Merodio
<?xml version='1.0' encoding='utf-8'?> <resource xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://datacite.org/schema/kernel-4" xsi:schemaLocation="http://datacite.org/schema/kernel-4 http://schema.datacite.org/meta/kernel-4.1/metadata.xsd"> <identifier identifierType="URL">https://zenodo.org/record/3362341</identifier> <creators> <creator> <creatorName>Sterpone, Luca</creatorName> <givenName>Luca</givenName> <familyName>Sterpone</familyName> <affiliation>Politecnico di Torino</affiliation> </creator> <creator> <creatorName>Azimi, Sarah</creatorName> <givenName>Sarah</givenName> <familyName>Azimi</familyName> <affiliation>Politecnico di Torino</affiliation> </creator> <creator> <creatorName>Bozzoli, Ludovica</creatorName> <givenName>Ludovica</givenName> <familyName>Bozzoli</familyName> <affiliation>Politecnico di Torino</affiliation> </creator> <creator> <creatorName>Du, Boyang</creatorName> <givenName>Boyang</givenName> <familyName>Du</familyName> <affiliation>Politecnico di Torino</affiliation> </creator> <creator> <creatorName>Lange, Thomas</creatorName> <givenName>Thomas</givenName> <familyName>Lange</familyName> <nameIdentifier nameIdentifierScheme="ORCID" schemeURI="http://orcid.org/">0000-0002-5002-3679</nameIdentifier> <affiliation>iRoC Technologies</affiliation> </creator> <creator> <creatorName>Glorieux, Maximilien</creatorName> <givenName>Maximilien</givenName> <familyName>Glorieux</familyName> <nameIdentifier nameIdentifierScheme="ORCID" schemeURI="http://orcid.org/">0000-0002-6731-0455</nameIdentifier> <affiliation>iRoC Technologies</affiliation> </creator> <creator> <creatorName>Alexandrescu, Dan</creatorName> <givenName>Dan</givenName> <familyName>Alexandrescu</familyName> <nameIdentifier nameIdentifierScheme="ORCID" schemeURI="http://orcid.org/">0000-0002-8294-7534</nameIdentifier> <affiliation>iRoC Technologies</affiliation> </creator> <creator> <creatorName>Polo, Cesar Boatella</creatorName> <givenName>Cesar Boatella</givenName> <familyName>Polo</familyName> <affiliation>European Space Agency</affiliation> </creator> <creator> <creatorName>Codinachs, David Merodio</creatorName> <givenName>David Merodio</givenName> <familyName>Codinachs</familyName> <affiliation>European Space Agency</affiliation> </creator> </creators> <titles> <title>A Novel Error Rate Estimation Approach for UltraScale+ SRAM-based FPGAs</title> </titles> <publisher>Zenodo</publisher> <publicationYear>2018</publicationYear> <dates> <date dateType="Issued">2018-11-22</date> </dates> <language>en</language> <resourceType resourceTypeGeneral="Text">Conference paper</resourceType> <alternateIdentifiers> <alternateIdentifier alternateIdentifierType="url">https://zenodo.org/record/3362341</alternateIdentifier> </alternateIdentifiers> <relatedIdentifiers> <relatedIdentifier relatedIdentifierType="DOI" relationType="IsIdenticalTo">10.1109/AHS.2018.8541474</relatedIdentifier> </relatedIdentifiers> <rightsList> <rights rightsURI="https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode">Creative Commons Attribution Non Commercial No Derivatives 4.0 International</rights> <rights rightsURI="info:eu-repo/semantics/openAccess">Open Access</rights> </rightsList> <descriptions> <description descriptionType="Abstract"><p>SRAM-based FPGA devices manufactured in FinFET technologies provide performances and characteristics suitable for avionics and aerospace applications. The estimation of error rate sensitivity to harsh environments is a major concern for enabling their usage on such application fields. In this paper, we propose a new estimation approach able to consider the radiation effects on the configuration memory and logic layer of FPGAs, providing a comprehensive Application Error Rate probability estimation. Experimental results provide a comparison between radiation test campaigns, which demonstrates the feasibility of the proposed solution.</p></description> <description descriptionType="Other">This work was supported as part of the RESCUE project that has received funding from the European Union's Horizon 2020 research and innovation programme under the Marie Skłodowska-Curie grant agreement No. 722325 and by the European Space Agency under contract No. 4000116569.</description> </descriptions> <fundingReferences> <fundingReference> <funderName>European Commission</funderName> <funderIdentifier funderIdentifierType="Crossref Funder ID">10.13039/501100000780</funderIdentifier> <awardNumber awardURI="info:eu-repo/grantAgreement/EC/H2020/722325/">722325</awardNumber> <awardTitle>Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems Design</awardTitle> </fundingReference> </fundingReferences> </resource>
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