Conference paper Open Access

A Novel Error Rate Estimation Approach for UltraScale+ SRAM-based FPGAs

Sterpone, Luca; Azimi, Sarah; Bozzoli, Ludovica; Du, Boyang; Lange, Thomas; Glorieux, Maximilien; Alexandrescu, Dan; Polo, Cesar Boatella; Codinachs, David Merodio


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    <dct:description>&lt;p&gt;SRAM-based FPGA devices manufactured in FinFET technologies provide performances and characteristics suitable for avionics and aerospace applications. The estimation of error rate sensitivity to harsh environments is a major concern for enabling their usage on such application fields. In this paper, we propose a new estimation approach able to consider the radiation effects on the configuration memory and logic layer of FPGAs, providing a comprehensive Application Error Rate probability estimation. Experimental results provide a comparison between radiation test campaigns, which demonstrates the feasibility of the proposed solution.&lt;/p&gt;</dct:description>
    <dct:description>This work was supported as part of the RESCUE project that has received funding from the European Union's Horizon 2020 research and innovation programme under the Marie Skłodowska-Curie grant agreement No. 722325 and by the European Space Agency under contract No. 4000116569.</dct:description>
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