Conference paper Open Access

Improving the Confidence Level in Functional Safety Simulation Tools for ISO 26262

Ahmet Cagri Bagbaba; Felipe Augusto Da Silva; Christian Sauer


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  <identifier identifierType="DOI">10.5281/zenodo.3361607</identifier>
  <creators>
    <creator>
      <creatorName>Ahmet Cagri Bagbaba</creatorName>
      <affiliation>Cadence Design Systems</affiliation>
    </creator>
    <creator>
      <creatorName>Felipe Augusto Da Silva</creatorName>
      <affiliation>Cadence Design Systems</affiliation>
    </creator>
    <creator>
      <creatorName>Christian Sauer</creatorName>
      <affiliation>Cadence Design Systems</affiliation>
    </creator>
  </creators>
  <titles>
    <title>Improving the Confidence Level in Functional Safety Simulation Tools for ISO 26262</title>
  </titles>
  <publisher>Zenodo</publisher>
  <publicationYear>2018</publicationYear>
  <dates>
    <date dateType="Issued">2018-10-24</date>
  </dates>
  <resourceType resourceTypeGeneral="Text">Conference paper</resourceType>
  <alternateIdentifiers>
    <alternateIdentifier alternateIdentifierType="url">https://zenodo.org/record/3361607</alternateIdentifier>
  </alternateIdentifiers>
  <relatedIdentifiers>
    <relatedIdentifier relatedIdentifierType="DOI" relationType="IsVersionOf">10.5281/zenodo.3361606</relatedIdentifier>
  </relatedIdentifiers>
  <rightsList>
    <rights rightsURI="https://creativecommons.org/licenses/by/4.0/legalcode">Creative Commons Attribution 4.0 International</rights>
    <rights rightsURI="info:eu-repo/semantics/openAccess">Open Access</rights>
  </rightsList>
  <descriptions>
    <description descriptionType="Abstract">&lt;p&gt;Higher Tool Confidence Level (TCL) is needed for tools used on the verification of safety-critical SoCs, aiming to achieve the required Automotive Safety Integrity Level in ISO 26262. This paper presents a methodology to improve the confidence level of functional safety verification flow. To do this, we compare the fault-list generated by the fault injection (FI) simulator with the Automatic Test Pattern Generation (ATPG) flow for stuck-at (SA) fault types. Moreover, we compare fault coverage results by using test vectors generated by the ATPG tool so the result of the FI simulation is compared to the results gained from the ATPG. This is a way to improve simulator&amp;rsquo;s confidence level by taking advantage of strength of the ATPG.&lt;br&gt;
&amp;nbsp;&lt;/p&gt;</description>
  </descriptions>
  <fundingReferences>
    <fundingReference>
      <funderName>European Commission</funderName>
      <funderIdentifier funderIdentifierType="Crossref Funder ID">10.13039/501100000780</funderIdentifier>
      <awardNumber awardURI="info:eu-repo/grantAgreement/EC/H2020/722325/">722325</awardNumber>
      <awardTitle>Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems Design</awardTitle>
    </fundingReference>
  </fundingReferences>
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