May 1, 2010 Dataset Open Access

Potthast, Martin; Stein, Benno; Eiselt, Andreas; Barrón-Cedeño, Alberto; Rosso, Paolo

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  <identifier identifierType="DOI">10.5281/zenodo.3250123</identifier>
  <creators>
    <creator>
      <creatorName>Potthast, Martin</creatorName>
      <givenName>Martin</givenName>
      <familyName>Potthast</familyName>
      <nameIdentifier nameIdentifierScheme="ORCID" schemeURI="http://orcid.org/">0000-0003-2451-0665</nameIdentifier>
      <affiliation>Bauhaus-Universität Weimar</affiliation>
    </creator>
    <creator>
      <creatorName>Stein, Benno</creatorName>
      <givenName>Benno</givenName>
      <familyName>Stein</familyName>
      <nameIdentifier nameIdentifierScheme="ORCID" schemeURI="http://orcid.org/">0000-0001-9033-2217</nameIdentifier>
      <affiliation>Bauhaus-Universität Weimar</affiliation>
    </creator>
    <creator>
      <creatorName>Eiselt, Andreas</creatorName>
      <givenName>Andreas</givenName>
      <familyName>Eiselt</familyName>
      <affiliation>Bauhaus-Universität Weimar</affiliation>
    </creator>
    <creator>
      <creatorName>Barrón-Cedeño, Alberto</creatorName>
      <givenName>Alberto</givenName>
      <familyName>Barrón-Cedeño</familyName>
      <affiliation>Universidad Polytécnica de Valencia</affiliation>
    </creator>
    <creator>
      <creatorName>Rosso, Paolo</creatorName>
      <givenName>Paolo</givenName>
      <familyName>Rosso</familyName>
      <affiliation>Universidad Polytécnica de Valencia</affiliation>
    </creator>
  </creators>
  <titles>
    <title>PAN Plagiarism Corpus 2010 (PAN-PC-10)</title>
  </titles>
  <publisher>Zenodo</publisher>
  <publicationYear>2010</publicationYear>
  <subjects>
    <subject>plagiarism</subject>
    <subject>plagiarism detection</subject>
    <subject>documents</subject>
    <subject>PAN</subject>
    <subject>2010</subject>
  </subjects>
  <dates>
    <date dateType="Issued">2010-05-01</date>
  </dates>
  <language>en</language>
  <resourceType resourceTypeGeneral="Dataset"/>
  <alternateIdentifiers>
    <alternateIdentifier alternateIdentifierType="url">https://zenodo.org/record/3250123</alternateIdentifier>
  </alternateIdentifiers>
  <relatedIdentifiers>
    <relatedIdentifier relatedIdentifierType="DOI" relationType="IsVersionOf">10.5281/zenodo.3250122</relatedIdentifier>
    <relatedIdentifier relatedIdentifierType="URL" relationType="IsPartOf">https://zenodo.org/communities/pan</relatedIdentifier>
    <relatedIdentifier relatedIdentifierType="URL" relationType="IsPartOf">https://zenodo.org/communities/webis</relatedIdentifier>
  </relatedIdentifiers>
  <rightsList>
    <rights rightsURI="https://creativecommons.org/licenses/by/4.0/legalcode">Creative Commons Attribution 4.0 International</rights>
    <rights rightsURI="info:eu-repo/semantics/openAccess">Open Access</rights>
  </rightsList>
  <descriptions>
    <description descriptionType="Abstract">&lt;p&gt;This corpus is outdated. Please use its successor PAN-PC-11: https://doi.org/10.5281/zenodo.3250095&lt;/p&gt;

&lt;p&gt;The PAN plagiarism corpus 2010 (PAN-PC-10) is a corpus for the evaluation of automatic plagiarism detection algorithms. For research purposes the corpus can be used free of charge.&lt;/p&gt;

&lt;p&gt;The PAN-PC-10 contains documents in which artificial plagiarism has been inserted automatically as well as documents in which simulated plagiarism has been inserted manually. The former have been constructed using a so-called random plagiarist, a computer program which constructs plagiarism according to a number of parameters, while the latter have been obtained with crowdsourcing via Amazon&amp;#39;s Mechanical Turk.&lt;/p&gt;</description>
    <description descriptionType="Other">{"references": ["Alberto Barr\u00f3n-Cede\u00f1o, Martin Potthast, Paolo Rosso, Benno Stein, and Andreas Eiselt. Corpus and Evaluation Measures for Automatic Plagiarism Detection. In Nicoletta Calzolari et al, editors, 7th Conference on International Language Resources and Evaluation (LREC 10), May 2010. European Language Resources Association (ELRA). ISBN 2-9517408-6-7."]}</description>
  </descriptions>
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