Journal article Open Access

MEMS MANUFACTURING AND RELIABILITY

Băjenescu, Titu-Marius I.


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{
  "files": [
    {
      "links": {
        "self": "https://zenodo.org/api/files/805600b8-3d20-40cf-b86a-07e772535913/JES%20-2019-1_65-82.pdf"
      }, 
      "checksum": "md5:4371d9e3909d3b88383a0a60ab8d0dd3", 
      "bucket": "805600b8-3d20-40cf-b86a-07e772535913", 
      "key": "JES -2019-1_65-82.pdf", 
      "type": "pdf", 
      "size": 1077878
    }
  ], 
  "owners": [
    60212
  ], 
  "doi": "10.5281/zenodo.2640042", 
  "stats": {
    "version_unique_downloads": 84.0, 
    "unique_views": 157.0, 
    "views": 174.0, 
    "version_views": 174.0, 
    "unique_downloads": 84.0, 
    "version_unique_views": 157.0, 
    "volume": 95931142.0, 
    "version_downloads": 89.0, 
    "downloads": 89.0, 
    "version_volume": 95931142.0
  }, 
  "links": {
    "doi": "https://doi.org/10.5281/zenodo.2640042", 
    "conceptdoi": "https://doi.org/10.5281/zenodo.2640041", 
    "bucket": "https://zenodo.org/api/files/805600b8-3d20-40cf-b86a-07e772535913", 
    "conceptbadge": "https://zenodo.org/badge/doi/10.5281/zenodo.2640041.svg", 
    "html": "https://zenodo.org/record/2640042", 
    "latest_html": "https://zenodo.org/record/2640042", 
    "badge": "https://zenodo.org/badge/doi/10.5281/zenodo.2640042.svg", 
    "latest": "https://zenodo.org/api/records/2640042"
  }, 
  "conceptdoi": "10.5281/zenodo.2640041", 
  "created": "2019-05-05T06:55:29.814884+00:00", 
  "updated": "2020-01-20T16:54:33.850253+00:00", 
  "conceptrecid": "2640041", 
  "revision": 4, 
  "id": 2640042, 
  "metadata": {
    "access_right_category": "success", 
    "doi": "10.5281/zenodo.2640042", 
    "description": "<p>Today flexibility means to produce reasonably priced customized products&nbsp;of high quality that can be quickly delivered to customers. The article analyses issues&nbsp;related to physic, able to generating defects, affecting the reliability limits for MEMS&nbsp;(Micro-Electro-Mechanical Systems). The MEMS industry is currently at a much more&nbsp;vulnerable position than it appears, regardless of how wonderful its future may look&nbsp;like. A full understanding of the physics and statistics of the defect generation is&nbsp;required to investigate the ultimate reliability limitations for nanodevices. Biggest&nbsp;challenge: cost effective, high volume production.</p>", 
    "language": "eng", 
    "title": "MEMS MANUFACTURING AND RELIABILITY", 
    "license": {
      "id": "CC-BY-4.0"
    }, 
    "journal": {
      "volume": "XXVI (1)", 
      "pages": "65-82", 
      "title": "Journal of Engineering Science"
    }, 
    "relations": {
      "version": [
        {
          "count": 1, 
          "index": 0, 
          "parent": {
            "pid_type": "recid", 
            "pid_value": "2640041"
          }, 
          "is_last": true, 
          "last_child": {
            "pid_type": "recid", 
            "pid_value": "2640042"
          }
        }
      ]
    }, 
    "communities": [
      {
        "id": "jes_utm"
      }
    ], 
    "keywords": [
      "Process errors", 
      "MEMS", 
      "optical MEMS", 
      "failure analysis", 
      "MEMS switches", 
      "package cracking", 
      "failure mechanisms", 
      "reliability", 
      "creep", 
      "lifetime prediction"
    ], 
    "publication_date": "2019-03-15", 
    "creators": [
      {
        "affiliation": "Swiss Technology Association, Electronics Group Switzerland", 
        "name": "B\u0103jenescu, Titu-Marius I."
      }
    ], 
    "access_right": "open", 
    "resource_type": {
      "subtype": "article", 
      "type": "publication", 
      "title": "Journal article"
    }, 
    "related_identifiers": [
      {
        "scheme": "doi", 
        "identifier": "10.5281/zenodo.2640041", 
        "relation": "isVersionOf"
      }
    ]
  }
}
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