Conference paper Open Access

Research of electrical parameters of the films of titanium oxide used in the formation of memristor's structures

Nagaichuk S.; Argunov D.; Troyan P.; Zhidik E.; Zmanovsky P.


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{
  "description": "<p>\u0411\u044b\u043b\u0438 \u0438\u0437\u0443\u0447\u0435\u043d\u044b \u044d\u043b\u0435\u043a\u0442\u0440\u0438\u0447\u0435\u0441\u043a\u0438\u0435 \u0441\u0432\u043e\u0439\u0441\u0442\u0432\u0430 \u043f\u043b\u0435\u043d\u043e\u043a \u043e\u043a\u0441\u0438\u0434\u0430 \u0442\u0438\u0442\u0430\u043d\u0430, \u043a\u043e\u0442\u043e\u0440\u044b\u0435 \u0431\u044b\u043b\u0438 \u0441\u0434\u0435\u043b\u0430\u043d\u044b \u0441 \u043f\u043e\u043c\u043e\u0449\u044c\u044e \u043c\u0430\u0433\u043d\u0435\u0442\u0440\u043e\u043d\u043d\u043e\u0433\u043e \u0440\u0430\u0441\u043f\u044b\u043b\u0435\u043d\u0438\u044f \u043a\u0430\u0442\u043e\u0434\u0430 \u0438\u0437 \u0442\u0438\u0442\u0430\u043d\u0430, \u0441\u0442\u0435\u0445\u0438\u043e\u043c\u0435\u0442\u0440\u0438\u0447\u0435\u0441\u043a\u0438\u0435 (TiO2) \u0438 \u043d\u0435\u0441\u0442\u0435\u0445\u0438\u043e\u043c\u0435\u0442\u0440\u0438\u0447\u0435\u0441\u043a\u0438\u0435 (TiOx) \u043a\u043e\u043c\u043f\u043e\u0437\u0438\u0446\u0438\u0438 \u0438\u0441\u043f\u043e\u043b\u044c\u0437\u0443\u044e\u0442\u0441\u044f \u0434\u043b\u044f \u0441\u043e\u0437\u0434\u0430\u043d\u0438\u044f \u044d\u043b\u0435\u043c\u0435\u043d\u0442\u043e\u0432 \u044d\u043d\u0435\u0440\u0433\u043e\u043d\u0435\u0437\u0430\u0432\u0438\u0441\u0438\u043c\u043e\u0439 \u043f\u0430\u043c\u044f\u0442\u0438 \u043c\u0435\u043c\u0440\u0438\u0441\u0442\u043e\u0440\u043d\u044b\u0435 \u0432. \u042d\u0442\u043e\u00a0\u041f\u043e\u043a\u0430\u0437\u0430\u043d\u043e\u00a0\u0447\u0442\u043e \u043d\u0435\u0441\u0442\u0435\u0445\u0438\u043e\u043c\u0435\u0442\u0440\u0438\u0447\u0435\u0441\u043a\u0438\u0435 TiOx \u043f\u043b\u0435\u043d\u043a\u0438 \u0438\u043c\u0435\u044e\u0442 \u0431\u043e\u043b\u0435\u0435 \u0432\u044b\u0441\u043e\u043a\u0443\u044e \u043f\u0440\u043e\u0432\u043e\u0434\u0438\u043c\u043e\u0441\u0442\u044c. \u0412 \u0441\u0442\u0440\u0443\u043a\u0442\u0443\u0440\u0430\u0445 \u0441 \u0434\u0432\u0443\u043c\u044f \u0441\u043b\u043e\u044f\u043c\u0438 \u0434\u0438\u044d\u043b\u0435\u043a\u0442\u0440\u0438\u043a\u0430 TiO2-TiOx \u044d\u043b\u0435\u043a\u0442\u0440\u0438\u0447\u0435\u0441\u043a\u043e\u0439 \u043f\u0440\u043e\u0447\u043d\u043e\u0441\u0442\u0438 \u043e\u043f\u0440\u0435\u0434\u0435\u043b\u044f\u0435\u0442\u0441\u044f \u044d\u043b\u0435\u043a\u0442\u0440\u0438\u0447\u0435\u0441\u043a\u043e\u0439 \u043f\u0440\u043e\u0447\u043d\u043e\u0441\u0442\u0438 \u043f\u043b\u0435\u043d\u043e\u043a TiO2. \u0417\u043d\u0430\u0447\u0435\u043d\u0438\u0435 \u0434\u0438\u044d\u043b\u0435\u043a\u0442\u0440\u0438\u0447\u0435\u0441\u043a\u043e\u0439 \u043f\u0440\u043e\u043d\u0438\u0446\u0430\u0435\u043c\u043e\u0441\u0442\u0438 TiO2 \u0438 TiOx \u043f\u043b\u0435\u043d\u043e\u043a \u0441\u0443\u0449\u0435\u0441\u0442\u0432\u0435\u043d\u043d\u043e \u0440\u0430\u0437\u043b\u0438\u0447\u0430\u044e\u0442\u0441\u044f.</p>", 
  "license": "http://creativecommons.org/licenses/by/4.0/legalcode", 
  "creator": [
    {
      "@type": "Person", 
      "name": "Nagaichuk S."
    }, 
    {
      "@type": "Person", 
      "name": "Argunov D."
    }, 
    {
      "@type": "Person", 
      "name": "Troyan P."
    }, 
    {
      "@type": "Person", 
      "name": "Zhidik E."
    }, 
    {
      "@type": "Person", 
      "name": "Zmanovsky P."
    }
  ], 
  "sameAs": [
    "http://www.konferenc.com/nagaichuk"
  ], 
  "image": "https://zenodo.org/static/img/logos/zenodo-gradient-round.svg", 
  "datePublished": "2016-12-26", 
  "headline": "Research of electrical parameters of the films of titanium oxide used in the formation of memristor's structures", 
  "url": "https://zenodo.org/record/221339", 
  "keywords": [
    "memristor", 
    "titanium oxide film TiO2 and TiOx", 
    "electrophysical parameters"
  ], 
  "@context": "https://schema.org/", 
  "identifier": "https://doi.org/10.5281/zenodo.221339", 
  "@id": "https://doi.org/10.5281/zenodo.221339", 
  "@type": "ScholarlyArticle", 
  "name": "Research of electrical parameters of the films of titanium oxide used in the formation of memristor's structures"
}
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