Journal article Open Access

The TiO2 Refraction Film for CsI Scintillator

C. C. Chen; C. W. Hun; C. J. Wang; C. Y. Chen; J. S. Lin; K. J. Huang

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<oai_dc:dc xmlns:dc="" xmlns:oai_dc="" xmlns:xsi="" xsi:schemaLocation="">
  <dc:creator>C. C. Chen</dc:creator>
  <dc:creator>C. W. Hun</dc:creator>
  <dc:creator>C. J. Wang</dc:creator>
  <dc:creator>C. Y. Chen</dc:creator>
  <dc:creator>J. S. Lin</dc:creator>
  <dc:creator>K. J. Huang</dc:creator>
  <dc:description>Cesium iodide (CsI) melt was injected into anodic aluminum oxide (AAO) template and was solidified to CsI column. The controllable AAO channel size (10~500 nm) can makes CsI column size from 10 to 500 nm in diameter. In order to have a shorter light irradiate from each singe CsI column top to bottom the AAO template was coated a TiO2 nano-film. The TiO2 film acts a refraction film and makes X-ray has a shorter irradiation path in the CsI crystal making a stronger the photo-electron signal. When the incidence light irradiate from air (R=1.0) to CsI’s first surface (R=1.84) the first refraction happen, the first refraction continue into TiO2 film (R=2.88) and produces the low angle of the second refraction. Then the second refraction continue into AAO wall (R=1.78) and produces the third refraction after refractions between CsI and AAO wall (R=1.78) produce the fourth refraction. The incidence light through TiO2 filmand the first surface of CsI then arrive to the second surface of CsI. Therefore, the TiO2 film can has shorter refraction path of incidence light and increase the photo-electron conversion efficiency.</dc:description>
  <dc:subject>Cesium iodide</dc:subject>
  <dc:title>The TiO2 Refraction Film for CsI Scintillator</dc:title>
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