Content description

1) JV
- directory "batch 3": samples corresponding to measurements of co-authors
	-> E6  ~ 100 nm thickness
	-> E10 ~ 200 nm thickness
- directory "batch 7": samples with 200 nm active layer thickness used for various different aging conditions (e.g. Fig. 1 in main paper)
	-> E1: nitrogen, elevated temperature, dark
	-> E2: nitrogen, elevated temperature, LED illumination
	-> E3: air, room temperature, dark
	-> E3 (with "quasi" in filename): after it was aged under above conditions, the sample did not show any aging effect => reused for aging under following conditions: air, elevated temperature, dark
	-> E4: air, room temperature, LED illumination
- files ending with "dark" or "am15" have been measured with simulated AM1.5 spectrum
- files containing the illumination intensity following the pattern "...0010msuns..." have been measured with monochromatic laser illumination; those are used to extract illumination-dependent short-circuit currents and open-circuit voltages, especially suns-Voc pairs

2) Impedance Spectroscopy
- contains capacitance--voltage and capacitance--frequency measurements

3) EQE, EL, PDS
- Igor Pro evaluation files containing sensitive EQE, EL and PDS measurements

4) GIWAXS
- line cuts of the GIWAXS measurements

5) Intensity-Modulated Spectroscopy
- raw data of IMPS on IMVS on a thin and thick sample

6) Simulation
- simulated JV, IMPS, IMVS, CV and Cf data for all three aging durations examined

7) TA
- TA raw data and Igor evaluation files

8) UPS
- UPS raw data and Igor evaluation files

9) VASE
- Ellipsometry raw data on fresh and aged samples

10) Voc Spectroscopy
- Igor Pro evaluation files of thin sample (s5) and thick sample (s9)